Transient characteristics simulation of total ionizing dose effect on Si n-metal-oxide-semiconductor field effect transistor under different gate voltage
نویسندگان
چکیده
In this work, we establish a novel numerical model of total ionizing dose effect and use it to simulate the radiation degradation Si n- metal-oxide-semiconductor field transistor (NMOSFET) under different bias voltages. The is based on capture/emission process traps, used transient characteristics semiconductor devices effect. simulation, changes trapped holes in Si/SiO<sub>2</sub> interface gate oxide layer are extracted, found that number at positions tends be saturated with increase dose. When voltage positive, amplitude threshold significantly higher than when negative. Whether applied positive or negative during radiation, shows trend first increasing then decreasing absolute value voltage. Radiation also has certain annealing after radiation. If device annealing, electrical recovery lower zero
منابع مشابه
Metal-Oxide-Semiconductor Field Effect Transistor (MOSFET)
The IGFET or MOSFET is a voltage controlled field effect transistor that differs from a JFET in that it has a “Metal Oxide” Gate electrode which is electrically insulated from the main semiconductor n-channel or p-channel by a very thin layer of insulating material usually silicon dioxide, commonly known as glass. This ultra thin insulated metal gate electrode can be thought of as one plate of ...
متن کاملTechnique for producing highly planar Si/SiO0.64Ge0.36 /Si metal–oxide–semiconductor field effect transistor channels
متن کامل
Capacitance-voltage studies on enhancement-mode InGaAs metal-oxide-semiconductor field-effect transistor using atomic-layer-deposited AI2O3 gate dielectric
متن کامل
Radiation therapy treatment unit dose-rate effects on metal–oxide–semiconductor field-effect transistor (MOSFET) detectors
Metal oxide semiconductor field effect transistor (MOSFET) detectors have recently been introduced to radiation therapy. However, the response of these detectors is known to vary with dose rate. Therefore, it is important to evaluate how much variation between the treatment prescribed dose and the dose that is actually delivered to the patient using high-energy photon or electron beams under co...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Chinese Physics
سال: 2023
ISSN: ['1000-3290']
DOI: https://doi.org/10.7498/aps.72.20230207